spectral simulation parameters Search Results


90
National Institute of Standards and Technology sessa version 2.1.1
Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of <t> electron </t> spectra for surface analysis <t> (SESSA). </t> The estimated uncertainty is up to 10% with a confidence level of 95%.
Sessa Version 2.1.1, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/sessa version 2.1.1/product/National Institute of Standards and Technology
Average 90 stars, based on 1 article reviews
sessa version 2.1.1 - by Bioz Stars, 2026-05
90/100 stars
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96
MathWorks Inc spectral simulation parameters
Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of <t> electron </t> spectra for surface analysis <t> (SESSA). </t> The estimated uncertainty is up to 10% with a confidence level of 95%.
Spectral Simulation Parameters, supplied by MathWorks Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/spectral simulation parameters/product/MathWorks Inc
Average 96 stars, based on 1 article reviews
spectral simulation parameters - by Bioz Stars, 2026-05
96/100 stars
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90
PERCH Solutions Ltd spectral simulation program
Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of <t> electron </t> spectra for surface analysis <t> (SESSA). </t> The estimated uncertainty is up to 10% with a confidence level of 95%.
Spectral Simulation Program, supplied by PERCH Solutions Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/spectral simulation program/product/PERCH Solutions Ltd
Average 90 stars, based on 1 article reviews
spectral simulation program - by Bioz Stars, 2026-05
90/100 stars
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90
Chemie GmbH parameters obtained from simulated epr spectra
Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of <t> electron </t> spectra for surface analysis <t> (SESSA). </t> The estimated uncertainty is up to 10% with a confidence level of 95%.
Parameters Obtained From Simulated Epr Spectra, supplied by Chemie GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/parameters obtained from simulated epr spectra/product/Chemie GmbH
Average 90 stars, based on 1 article reviews
parameters obtained from simulated epr spectra - by Bioz Stars, 2026-05
90/100 stars
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90
PERCH Solutions Ltd perch spectral simulation programme version 2013.1 sa
Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of <t> electron </t> spectra for surface analysis <t> (SESSA). </t> The estimated uncertainty is up to 10% with a confidence level of 95%.
Perch Spectral Simulation Programme Version 2013.1 Sa, supplied by PERCH Solutions Ltd, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/result/perch spectral simulation programme version 2013.1 sa/product/PERCH Solutions Ltd
Average 90 stars, based on 1 article reviews
perch spectral simulation programme version 2013.1 sa - by Bioz Stars, 2026-05
90/100 stars
  Buy from Supplier

Image Search Results


Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of  electron  spectra for surface analysis  (SESSA).  The estimated uncertainty is up to 10% with a confidence level of 95%.

Journal: Nanomaterials

Article Title: Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements

doi: 10.3390/nano11030639

Figure Lengend Snippet: Areas of the peaks corrected with the intensity–energy response function (IERF) of the spectrometer. These values were used for the calculation with simulation of electron spectra for surface analysis (SESSA). The estimated uncertainty is up to 10% with a confidence level of 95%.

Article Snippet: Input parameters for SESSA (simulation of electron spectra for surface analysis version 2.1.1) by the National Institute of Standards and Technology (NIST), Standard Reference Database Program SRD 100.

Techniques:

 Input parameters for SESSA  and mean free paths (IMFP: inelastic mean free path; EMFP: elastic mean free path).

Journal: Nanomaterials

Article Title: Reliable Surface Analysis Data of Nanomaterials in Support of Risk Assessment Based on Minimum Information Requirements

doi: 10.3390/nano11030639

Figure Lengend Snippet: Input parameters for SESSA and mean free paths (IMFP: inelastic mean free path; EMFP: elastic mean free path).

Article Snippet: Input parameters for SESSA (simulation of electron spectra for surface analysis version 2.1.1) by the National Institute of Standards and Technology (NIST), Standard Reference Database Program SRD 100.

Techniques: Plasmid Preparation